|Space Telescope Science Institute|
|STIS Instrument Handbook|
A good slit for echelle observations of extended sources with isolated emission lines.This slit can be used with all echelle gratings. Please note that use of this slit with an extended source will produce order overlap and may make analysis difficult (see also Section 13.7).
Table 13.27: 6X0.2 Aperture Throughputs
Figure 13.74: 6X0.2 Aperture Throughput as a Function of Wavelength