Imaging Strategies
Imaging must be planned with several factors in mind. Taken together, these
factors require one to make trade-offs in selecting the number and duration
of exposures, the placement of exposures on the detector, and the observing
configuration.
CCD
Read noise:
Read noise can be significant in observations of faint objects. Fortunately, read
noise is less for CCDGAIN=1 than for CCDGAIN=4. On-chip
binning
has been recommended to reduce the read noise by the binning factors. Binning,
however, also increases the percentage of the image affected by
hot pixels
(which are becoming
more
numerous) and cosmic rays. Binning thus becomes less desirable with later epoch
and longer exposure time.
Hot pixels:
The number of hot pixels has been steadily
increasing, making on-chip
binning
less favorable and
dithering
more desirable. If exposures are dithered by a few pixels, hot pixels can be
rejected like cosmic rays when the images are registered and combined. Dithering
can be implemented in Phase 2 with the use of
patterns.
Cosmic rays:
Two or more exposures should be taken, either with
CR-SPLIT
or in combination with
dithering,
so that cosmic rays can be rejected when the images are combined. Dithering can be
implemented in Phase 2 with the use of
patterns.
Charge transfer efficiency:
CTE of the CCD detector steadily decreases with time in orbit due to radiation
damage. Charge transfer is more efficient for greater count levels in the target
and in the background, so longer exposure times and
filters with broader passbands can reduce signal loss and image distortion.
Losses are less for sources in rows closer to the readout amplifier, so specifying
a subarray
high on the detector can also reduce loss.
Saturation:
Saturation occurs at a higher level for
CCDGAIN=4
than for
CCDGAIN=1.
Nonlinear amplification occurs at levels somewhat below saturation for CCDGAIN=1.
Saturation does not damage the detector, so it can be tolerated if it does not
occur at locations of interest or bleed charge into them along columns.
PSF sampling:
The CCD marginally undersamples the HST PSF at
optical wavelengths. Some improvement in spatial resolution can be gained by
subpixel
dithering. Dithering can be implemented in Phase 2 with the use of
patterns.
Flat field accuracy:
Flat fielding can be the dominant source of error in observations with very
high
signal-to-noise.
Dithering
can improve the signal-to-noise by smoothing out flat field errors.
MAMA
Bright object limits:
Local and global
count rate limits must be met for the aperture area at any position angle
allowed for the exposure, and within 5 arcsec beyond that area. This requirement
applies to the combined four quadrants of the F25NDQ
neutral-density
filter. Less severe limits must be met within an additional
buffer zone. There are several
strategies
for reducing the flux received from a bright target or bright companion object.
Additionally, you may be able to exclude a bright companion object from the
critial area by selecting a limited position angle range
(ORIENT
range) for the aperture. Application of MAMA bright object limits to
solar system
observations can be found in the STIS Instrument Handbook.
Time resolution:
Time-resolved observations can be made either in
ACCUM
mode or in
TIME-TAG mode. The minimum sampling time is shorter in TIME-TAG mode, but
other timing
constraints can also affect the
choice of mode
. For TIME-TAG mode, one must choose the
BUFFER-TIME
to control the frequency of data transfer. TIME-TAG analysis is described in
STIS ISR 2000-02. Errors in the initial
processing of TIME-TAG data are described in the STANs for March 2001 and June 2001.
Saturation:
The STIS internal buffer limits MAMA images to 65,536 photons per pixel.
PSF sampling:
PSF sampling can be improved by using the
highres
mode image, at the cost of flat field accuracy and signal-to-noise. Native format
pixels marginally undersample the HST PSF. Some improvement in spatial resolution
can be gained by subpixel
dithering.
Dithering can be implemented in Phase 2 with the use of
patterns.
Flat field accuracy:
Flat fielding can be the dominant source of error in
high
signal-to-noise observations.
Dithering
can improve the signal-to-noise by smoothing out flat field errors.
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