STIS Instrument Detectors
STIS has three large-format (1024 x 1024 pixel) detectors:
CCD: Scientific Image Technologies (SITe) CCD
with ~0.05 arcsecond square pixels, covering a nominal 52 x 52
arcsecond square field of view (FOV), operating from ~2000 to 10,300 Å.
NUV-MAMA: Cs2Te Multi-Anode Microchannel
Array (MAMA) detector with ~0.024 arcsecond square pixels, and a nominal 25 x 25
arcsecond square field of view (FOV), operating in the near ultraviolet from 1600
to 3100 Å.
FUV-MAMA: Solar-blind CsI MAMA with ~0.024
arcsec-pixels, and a nominal 25 x 25 arcsecond square FOV, operating in the far
ultraviolet from 1150 to 1700 Å.
Characteristic |
CCD Performance |
| Architecture |
Thinned, backside illuminated |
| Wavelength range |
2000-11,000 Å |
| Pixel format |
1024 x 1024 illuminated pixels |
| Field of view |
52 x 52 arcseconds |
| Pixel size |
21 x 21 µm |
| Pixel plate scale |
0.05071 arcseconds |
| Quantum efficiency |
~ 20% @ 3000 Å
~ 67% @ 6000 Å
~ 29% @ 9000 Å |
| Dark count at -83° C |
0.003 e- sec-1 pix-1 |
| Read noise |
4.4-5.3 e- rms at GAIN=1*
7.3-7.8 e- rms at GAIN=4 |
| Full well |
144,000 e- over the inner portion of the detector
120,000 e- over the outer portion of the detector |
| Saturation limit |
33,000 e- at GAIN=1
144,000 e- at GAIN=4 |
* When STIS began operating with "Side 2" electronics in July 2001,
CCD read noise increased from 4.4 to 5.3 e- for GAIN=1, and from 7.3
to 7.75 e- for GAIN=4. ETC calculations use the most recent estimates
of the read noise.
** See also ISR 98-31: STIS CCD
Performance Monitor
The STIS/CCD is a low-noise device capable of high sensitivity in the visible and
the near UV. It is a thinned, backside-illuminated device manufactured by
Scientific Imaging Technologies (SITe). In order to provide a near-UV imaging
performance, the CCD was backside-treated and coated with a wide-band
anti-reflectance coating. The process produces acceptable near-UV quantum
efficiency (QE) without compromising the high QE of the visible bandpass.
The CCD has only one operating mode,
ACCUM,
for imaging and spectroscopy. Electrons which accumulate in the CCD wells are read
out and converted to data numbers by the analog-to-digital converter. The
conversion factor can be selected by the
CCDGAIN
parameter. While the default is CCDGAIN=1, a CCDGAIN=4 value can be chosen if CCD
saturation is a concern. Scientific data are obtained on 1024 x 1024 pixels
for a full
readout.
The CCD supports both on-chip
binning and
the use of sub-arrays.
Additional CCD Information:
CCD Bias
Subtraction and Amplifier Non-Linearity
Detector
Backgrounds
CCD
Subarrays
CCD Shutter
Effects
Cosmic Rays
CCD Optical
Performance
Fringing due
to the Order Sorter Filters
IR
Fringing
Fringing
Amplitude in Percent as a Function of Wavelength
ISR 98-19: STIS Near-IR Fringing. II. Basics
...
ISR 98-29: STIS Near-IR Fringing. III.
Residual
fringe amplitude after flat-fielding
Comparison of De-fringing Capabilities of Flats
Change to
Side 2 operations
ISR 2001-05:
Read Noise During Side-2 Operations
ISR 2001-03:
Temperature Dependence of the Dark Rate...
Hot Pixels
ISR 98-06: STIS CCD Anneals
CL Script for Creating Daily Dark Files
Monthly Hot Pixel Anneal Monitor
Charge
Transfer Efficiency
UV Light and
the STIS CCD
Spectroscopic
CCD Obs at wavelengths > 2500 Å
| Photocathode |
CsI |
Cs2Te |
| Wavelength range |
1150-1700 Å |
1600-3100 Å |
| Pixel format |
1024 x 1024 |
1024 x 1024 |
| Pixel size |
25 x 25 µm |
25 x 25 µm |
| Image mode pixel plate scale |
0.0245 x 0.0247 arcseconds (clear) 0.0246 x 0.0247 arcseconds
(filtered) |
0.0245 x 0.0248 arcseconds |
| Field of view |
25.1 x 25.3 arcseconds |
25.1 x 25.4 arcseconds |
| Quantum efficiency |
25% @ 1216 Å |
10% @ 2537 Å |
| Dark count |
5 x 10-6 to 1 x 10-5 counts sec-1
pix-1 |
8 x 10-4 to 1.7 x 10-3 counts sec-1
pix-1 |
| Global count-rate linearity limit
1 |
285,000 counts sec-1 |
285,000 counts sec-1 |
| Local count-rate linearity limita |
~220 counts sec-1 pix-1 |
~340 counts sec-1 pix-1 |
The STIS MAMA detectors are photon-counting devices which process events serially.
In MAMA
ACCUM mode, photons are accumulated into a 2048 x 2048 array in the STIS data
buffer memory as they are received. In
TIME-TAG
mode, the MAMA produces an event stream of data points with a time resolution of
125 microseconds.
MAMA
Bright Object Protection
The MAMAs are subject to catastrophic damage at high global and local count rates
and cannot be used to observe sources which exceed the defined
safety
limits. Observers will have to adjust their observing strategies if a target
exceeds these limits. The STIS Imaging and
Spectroscopic Exposure Time Calculators issue a warning if an applicable
limit is exceeded.
Additional MAMA information:
Saturation
Overflowing the 16 Bit Buffer
MAMA
Non-linearity
On-board
Doppler Compensation
MAMA ACCUM
and TIME-TAG
Modes
TIME-TAG
Event Processing
Spectral Mode
Offsetting
Out-of-Band
Spectral Response of Clear Imaging Modes
MAMA Dark
Current
FUV-MAMA
and
NUV-MAMA
Dark Current
FUV-MAMA Dark Current Glow Image Files
NUV-MAMA
Dark Current vs Temperature
ISR 99-02: Scientific Requirements for
Thermal Control
MAMA
Bright Object Protection
MAMA
Bright Object Limits
Absolute
MAMA Count Rate Limits
ISR 2000-01: Revised Bright Object Protection
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