New CTE Correction Formula Available from Dolphin (2000)
-B. Whitmore
There is a paper that may be of interest to many WFPC2
users. The paper, authored by Andrew Dolphin, is titled "The
Charge-Transfer Efficiency and Calibration of WFPC2" (Dolphin, 2000,
PASP, 112, 1397). The paper compares WFPC2 observations with ground
based observations of Omega Centauri and NGC 2419, using a baseline
through March 2000, roughly a year longer than available for a similar
study by Whitmore, Heyer, and Casertano (1999, PASP, 111, 1559). In
general, Dolphin finds good agreement with the Whitmore, Heyer, and
Casertano results, and the longer baseline and more extensive data set
used by Dolphin result in less scatter in the residuals. In
particular, Dolphin finds similar corrections to within a few hundreths
of a magnitude in all cases except for recent (1998 and later) data
with low counts. In these case the Dolphin corrections are larger than
the Whitmore et al. corrections.
A preliminary comparison of the two formulae using August 2000
observations of Omega Cen confirms that the Dolphin formulae results in
smaller residuals over most of the range of typical observations.
Besides the tendency for the Whitmore et al. formula to underestimate
the required correction for faint stars (i.e., in the range 100 - 500
electrons), as reported by Dolphin, we also find that the Whitmore et
al. formula overestimates the required correction for very bright stars
(i.e., brighter than 15,000 electrons) by a few percent. However, we
also found that for extremely faint stars (i.e., 20 - 50 electrons),
the Dolphin formulae overestimates the required correction by tens of
percent, presumably because he was not able to constrain this part of
the parameters space since he used ground-based observations for the
comparison, which limits the sample to brighter stars. Hence, at
present, the best compromise is probably to use the Dolphin formula for
stars brighter than 100 electrons and the Whitmore, Heyer, Casertano
formula for fainter stars.
Figure 1 shows the ratio of
counts from a 14 second exposure of Omega
Cen in August, 2000 to the counts in a 100 second exposure, vs. the Y
position on the chip (WF2 in this case with gain=15). The raw values
(filled circles) fall below a ratio of 0.14 due to CTE loss (i.e., the
count rate and background are both lower for the short exposure,
leading to more CTE loss). The different panels are for different
target brightness, as described by the labels. The filled squares show
the values corrected using the Whitmore, Heyer, and Casertano formula
while the filled triangles show the values corrected using the Dolphin
formula. Note that the Dolphin formula is somewhat better for the top 4
panels, but is much worse for the faintest stars in the bottom panel.
An ISR is currently being written on this comparison and should be out
shortly.
Some comments on preflashing. CTE loss can be reduced by increasing the
background, hence filling some of the traps before the target reaches
them. One can artificially enhance the background by adding a preflash.
The problem with this approach is that this also adds noise.
Figure 2
shows a calculation based on the Whitmore, Heyer, Casertano (1999)
correction formula, assuming a very low background for the raw image
(i.e., 0.1 electron, appropriate for a very short exposure, a
narrow-band exposure, or an exposure in the UV) versus an exposure
which has been preflashed with 25 electrons. The ratio of the S/N for
the preflashed image versus the raw image is plotted vs the Log of the
target brightness. The S/N estimates include the uncertainties in the CTE
corrections. The three curves show the effects for a star near
the bottom of the chip (i.e., X = 400, Y = 100, where the preflash is
never an advantage since CTE loss is low and the preflash adds noise),
near the center of the chip, and near the top of the chip (where the
preflash is an advantage for the brighter targets). For more typical
cases where the background is already sizeable, the gains due to a
preflash are even smaller. We also note that preflashing may
significantly increase the overhead time for an exposure.
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