Instrument Science Report 00-04:
How CTE Affects Extended Sources
A. Riess
Sept. 28, 2000
Abstract
We investigate the effects of CTE on the shape and structure of extended sources. We subtracted pairs of images of individual galaxies observed near and far from the read-out amplifier. The average profile of the galaxy residuals is distinctly asymmetric and indicates that charge is primarily lost from the amplifier side of the galaxy image. The side of the galaxy away from the amplifier suffers little charge loss because charge traps are encountered have been filled and in addition, charge is detrapping. These results are by a simple model of the read-out process.
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