Ground test characterization of the multiband imaging photometer for SIRTF (MIPS)

E. T. Young, G. H. Rieke, J. Cadien, H. A. Dole, C. W. Englebracht, K. D. Gordon, G. B. Heim, D. M. Kelly, & J. A. Stansberry 2003, in "IR Space Telescopes and Instruments", (SPIE vol. 4850), ed. J. C. Mather, 475

We describe the ground testing and characterization of the Multiband Imaging Photometer for SIRTF (MIPS). This instrument is a camera with three focal plane arrays covering broad spectral bands centered at 24 micron, 70 micron, and 160 micron. The instrument features a variety of operation modes that permit accurate photometry, diffraction-limited imaging, efficient mapping, and low resolution spectral energy distribution determinations. The observational philosophy of MIPS relies heavily on the frequent use of internal relative calibration sources as well as a high level of redundancy in the data collection. We show that by using this approach, users of MIPS can expect very sensitive, highly repeatable observations of astronomical sources. The ground characterization program for MIPS involved a number of facilities including test dewars for focal-plane level testing, a specialized cryostat for instrument-level testing, and tests in the flight SIRTF Cryo-Telescope Assembly

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