Charge Transfer Inefficiency
Charge transfer efficiency (CTE) describes how effectively a CCD transfers charge from one pixel to another during readout. While CTE was measured to be >99.9999% during TV2 on the backup UVIS detector, it has been gradually declining on WFC3/UVIS as a consequence of ongoing radiation damage to the silicon lattice of the detector.
CTE losses, also known as charge transfer inefficiency (CTI), manifests as vertical trails attached to sources, pointing away from the output amplifier. In full-frame images, CTI can make sources appear to be "melting" towards the chip gap.
You can increase the background to mitigate CTI (effectively filling potential traps) by adjusting filter choice, increasing post-flash, or using a longer exposure time. For WFC3/UVIS observations, the calwf3 pipeline produces CTI-corrected files (FLCs) for WFC3/UVIS observations.
The WFC3 team monitors CTI through yearly calibration programs; current information is posted on the CTE webpage.
Right: an example of CTI in a UVIS/F467M image (HST observation rootname idaz05ieq). Note that sources at the top of UVIS 1 and bottom of UVIS 2 appear much more point-like than sources near the center, which are accompanied by trails pointing towards the chip gap.
The WFC3 team monitors CTI through yearly calibration programs; current information is posted on the CTE webpage.
More information:
ISR 2007-13: UVIS CCD EPER CTE measurements performed during the April 2007 Ambient Calibration campaign (SMS UV02S01)
M. Robberto 30 Apr 2007