Earlier reports Convert Day of Year

The Hubble Space Telescope

Unlocking the Secrets of the Universe

Daily Report #8710

Period Covered:
08:00 PM May 18, 2020 - 07:59 PM May 19, 2020
(DOY 140/0000z - 140/2359z)

Program Principal Investigator Program Title
Science Observations Scheduled
15640 Adam Riess, The Johns Hopkins University The Search for New Physics Amid the Hubble Constant Tension
15647 Harry Teplitz, California Institute of Technology Ultraviolet Imaging of the Cosmic Assembly Near-infrared Deep Extragalactic Legacy Survey Fields (UVCANDELS)
15653 Paul Kalas, University of California - Berkeley Optical coronagraphic imaging of debris disks newly resolved around young stars
15832 Luciana Bianchi, The Johns Hopkins University How do stars become white dwarfs?
15879 Adam Riess, The Johns Hopkins University A Measurement of the Gaia Offset to Build a Superior Distance Ladder and Resolve the Origin of the Hubble Tension
15900 Hsiang-Chih Hwang, The Johns Hopkins University Discovery of Sub-kpc Dual Active Galactic Nuclei from Gaia
15954 Steven Parsons, University of Sheffield The first pulsating white dwarf in an eclipsing binary
15975 Xin Liu, University of Illinois at Urbana - Champaign Host Galaxy Morphologies of Candidate Sub-parsec Binary Supermassive Black Holes: Testing the Merger Hypothesis
16080 Alexandra Mannings, University of California - Santa Cruz Resolving the Host Galaxies of Fast Radio Bursts
Calibration Observations Scheduled
15713 Heather Kurtz, Space Telescope Science Institute UVIS Bowtie Monitor
15715 Catherine Martlin, Space Telescope Science Institute WFC3 UVIS CCD Daily Monitor Part 2
15717 Jennifer Medina, Space Telescope Science Institute WFC3 UVIS CCD Unflashed (CTE) Monitor
15718 Catherine Martlin, Space Telescope Science Institute WFC3 UVIS Post-flash Monitor
15732 Jennifer Medina, Space Telescope Science Institute WFC3 CSM Monitor with Earth Flats
15736 Matthew Maclay, Space Telescope Science Institute STIS CCD Dark Monitor Part 2
15739 Matthew Maclay, Space Telescope Science Institute STIS CCD Bias and Read Noise Monitor Part 2